The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...
Tokyo Electron Ltd. (TEL) and Teseda Corp. today announced that they have combined efforts for an integrated design for testability (DFT) system. The demonstration system consists of the Wafer Prober ...
A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...
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