As device complexity grows and fabrication costs continue to fall, test is emerging as the largest expense in complex SOC (system-on-chip) IC manufacturing. At the same time, ICs continue to ...

Deep submicron technology enabled the design of the industry's first very large chips. The magnitude of the design effort involved in creating these chips led to the adoption of reuse methodologies ...

This chapter will discuss the many aspects of production testing for wireless SOC devices. Highly integrated wireless SOC devices must supplement the traditional parasitic testing (power, phase noise, ...