The huge number of ICs used in today’s electronic products is difficult to comprehend, and each one has to be tested. Traditionally, testing starts at the wafer level to determine gross defects. By ...

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

The Ohm-Stat RT-1000 from Static Solutions tests the resisitivity, humidity and temperature of all conductive, antistatic and static-dissipative surfaces for ...

A selection of probes, from [Jim Williams’] Linear Technology app note 72. It’s not often that we are shown an entirely new class of test equipment here at Hackaday, so it was with some surprise that ...