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The Izod impact test fixes one end of a notched specimen in a cantilever position by means of a vice. A striker on the arm of a pendulum or similar energy carrier then strikes the specimen. The energy ...
PAT is a dynamic test. Let's consider, for example, the EWS (Electrical Wafer Sort) process, the testing procedure of a silicon wafer containing ICs. This procedure is performed by a mechanical probe ...
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