Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
Premature finishing, overworking the surface and inadequate curing are typical causes of surface defects on exterior slabs. Some of these defects include premature wear, scaling, mortar flaking and ...
Defect states refer to electronic energy levels that arise from imperfections or irregularities in the crystal structure of materials, particularly in semiconductors and insulators. These ...
Graphene and hexagonal Boron Nitride possesses exceptional chemical and physical properties. Recent experimental results ...
Several vendors are ramping up new inspection equipment based on infrared, optical, and X-ray technologies in an effort to reduce defects in current and future IC packages. While all of these ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
It may contain inaccuracies due to the limitations of machine translation. Researchers inspect the quality of a fabricated silicon heterojunction solar cell. Provided by KIER A Korean research team ...
Onto has received multiple orders in support of high bandwidth memory (HBM), advanced logic and a variety of specialty segments WILMINGTON, Mass.--(BUSINESS WIRE)--Onto Innovation Inc. (NYSE: ONTO) ...
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