Tech Xplore on MSN
Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Inside the migration from a legacy custom VB.NET vision system to Keyence's VS-Series smart camera to streamline part ...
Tech Xplore on MSN
Novel AI method sharpens 3D X-ray vision
X-ray tomography is a powerful tool that enables scientists and engineers to peer inside of objects in 3D, including computer ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
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