Abstract: The demeanour of many chemical and non-chemical processes resemble that of an integrating process. Developing a control plan for an integrating process is complicated, and the difficulty ...
Abstract: Hafnium-based Ferroelectric Field-Effect Transistors (FeFETs) suffer from limited endurance. In-depth understanding of the trap behaviour during failure process is crucial for endurance ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results